MPi Kestral Probe Cards






Canteliver Probe Card

MPI Cantilever Probe Card is widely utilized on gold bump and pad wafer screening for Screen driver, logic, and memory unit. MPI’s cantilever probes will be the corresponding answer to the requires of fi­ne pitch, smaller pad measurement, large speed, much less cleansing, multi-DUT, large pin count, and ultra-minimal leakage needs. With fantastic craftsmanship, innovative architecture and demonstrated methodologies dependant on mechanical and electrical simulation/measurement benefits, making MPI the highest cantilever provider worldwide.


FCB Probe Card

The FCB Probe Card is easily the most mature technology of buckling beam probe card. It can be aimed to attain the semiconductor ship manufacture time-to-market place (TTM) and price of check (COT) desire. FCB is a confirmed Option for a number of semiconductor generation checks from early engineering pilot-runs to substantial quantity producing (HVM). FCB is ready for system necessitating high signal integrity probing (SI) and/or electrical power integrity probing (PI). Apps include things like reducing-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, plus much more. FCB ensures the whole world’s most effective In general Price-of-possession (COO) for many DUT apps.


EVS Probe Card

The EVS Probe Card can be an enhancement above the conventional buckling beam probe card. Critical functions are better present carrying capacity (C.C.C.) and decrease well balanced Make contact with power (BCF), and Total MEMS-like qualities. EVS can certainly meet the prerequisite of Innovative wafer probing. Exact alignment and fantastic planarity Manage are classified as the vital things contributing to secure Get hold of resistance. With its ability and general performance, EVS Probe Card is a super option for State-of-the-art probe playing cards.


Osprey probe card

The Osprey probe card is MPI’s Resolution to desire for at any time finer pitch. It is designed for smaller Al pad, and is particularly perfect for very small pitch application with peripheral and whole array sample. With specific alignment and much better planarity Handle, Osprey can access bigger productivity by multi-DUT style.  The forming wire (FW) sort needle generated with MPI’s have micro fabrication process not just delivers higher-top quality effectiveness but will also will allow easy read more needle replacement and shortens maintaining cycle time.



Kestrel Probe Card

The Kestrel Probe Card is equipped with MEMS wire (MW) needle which is designed for the demand from customers of small drive probing. In addition it comes along with the opportunity to satisfy large C.C.C. and large pin counts application. The MEMS procedure ensures really dependable needle features, plus the Specific composition layout allows exact alignment and planarity control.


MPI probe card division provides a wide range of solutions to the semiconductor wafer level test market. Integrated Circuit (IC) applications include Drivers, Logic, CIS, RF, Flip Chip and Cu Pillars. MPI’s comprehensive designs, robust manufacturing and state-of-the-art tooling, enables MPI to provide unsurpassed solutions globally for your challenges both today and for many generations to come.

https://www.mpi-corporation.com/probecard/

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